During 2019, members of the P2654 group have contributed papers and presentations for a number of technical conferences. Some of these presentations are now available for you to view or download.
AutoTestCon 2019 (National Harbor, MaryLand):
International Test Conference 2019 (Washington, DC):
- P2654 Poster (PDF)
- How IEEE P1687.1 and IEEE P2654 can cooperate to access on-chip instruments during system assembly test (small format slides with notes, PDF)
You are free to share these presentations but please credit sjtag.org or the P2654 Working Group.